AEC_Q100_Rev_G_Base_Document(11)

车用电子产品的执行标准。

AEC - Q100 - REV-G

May 14, 2007

Automotive Electronics Council

Component Technical Committee

4.2

Device Specific Tests

The following tests must be performed on the specific device to be qualified for all hermetic and plastic packaged devices. Generic data is not allowed for these tests. Device specific data, if it already exists, is acceptable.

1.

2. Latch-up (LU) - All product.

3. Electrical Distribution - The supplier must demonstrate, over the operating temperature grade,

device specification. This data must be taken from at least three lots, or one matrixed (or skewed) process lot, and must represent enough samples to be statistically valid, see Q100-009. It is strongly recommended that the final test limits be established using AEC-Q001 Guidelines For Part Average Testing.

4. Other Tests - A user may require other tests in lieu of generic data based on his experience with a

particular supplier.

4.3

Wearout Reliability Tests

Testing for the failure mechanisms listed below must be available to the user whenever a new technology or material relevant to the appropriate wearout failure mechanism is to be qualified. The data, test method, calculations, and internal criteria need not be demonstrated or performed on the qualification of every new device, but should be available to the user upon request.

Electromigration

Hot Carrier Injection - for all MOS technologies below 1 micron

Page 8 of 32