AEC_Q100_Rev_G_Base_Document(4)

车用电子产品的执行标准。

AEC - Q100 - REV-G

May 14, 2007

Automotive Electronics Council

Component Technical Committee

FOR PACKAGED INTEGRATED CIRCUITS

Text enhancements and differences made since the last revision of this document are shown as underlined areas. Several figures and tables have also been revised, but changes to these areas have not been underlined.

1.

SCOPE

test driven qualification requirements and references test conditions for qualification of integrated circuits

Use of this document does not relieve the IC supplier of their responsibility to meet their own company's internal qualification program. In this document, "user" is defined as all customers using a device qualified per this specification. The user is responsible to confirm and validate all qualification data that substantiates conformance to this document. Supplier usage of the device temperature grades as stated in this specification in their part information is strongly encouraged.

1.1 1.2

Purpose

The purpose of this specification is to determine that a device is capable of passing the specified stress tests and thus can be expected to give a certain level of quality/reliability in the application. Reference Documents

Current revision of the referenced documents will be in effect at the date of agreement to the qualification plan. Subsequent qualification plans will automatically use updated revisions of these referenced documents.

Automotive

AEC-Q001 Guidelines for Part Average Testing AEC-Q002 Guidelines for Statistical Yield Analysis

AEC-Q003 Guidelines for Characterizing the Electrical Performance SAE J1752/3 Integrated Circuits Radiated Emissions Measurement Procedure

Military

MIL-STD-883 Test Methods and Procedures for Microelectronics

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